DEIS - University of Bologna

MicroLAB Research Topics

The Microelectronics laboratory main research topics are in the area of the characterization of semiconductor devices with particular regard to the following phenomena:

Hot electrons induced degradation and photon emission in silicon MOSFETS
Thin dielectric reliability
Non-volatile memories physics and reliability characterization
Latch-up in CMOS structures
Thermal and parasitic effects in GaAs devices
Test of digital integrated circuits; development of original testing techniques.
Characterization of faulty circuits behavior
Development of design for testability techniques
Development of fault simulation algorithms for digital ICs.