Prof. Massimo Lanzoni

Prof. Massimo Lanzoni
DEIS, University of Bologna,
Viale Risorgimento, 2
40136 Bologna - Italy
Phone: (+39) 51 209-3078 
Fax: (+39) 51 209-3785

email:    massimo.lanzoni at


Prof. Lanzoni was born in Bologna (Italy) on August 9th 1961. He received the ``Laurea in Ingegneria Elettronica'' from the University of Bologna in 1987.

Since then he has been with the Microelectronics Research Group at the Department of Electronics at the same University working on research projects in the fields of the experimental characterization and simulation of NV memory cells and MOS devices, automatic test of VLSI devices.

In particular his scientific interests cover the characterization of thin dielectrics reliability, non-volatile memory cell characteristics and reliability, MOS transistors experimental characterization and new techniques for IC testing as NV memories endurance testing and CMOS IC latch-up testing, moder instrumentation, advanced sensors and sensor networks.
He is now involved in projects concerning applications of advanced instrumentation and electronic design  for industral and biomedical applications.


Elettronica T-2 Corso di Laurea in Ingegneria Informatica
Laboratorio di Elettronica T Corso di Laurea in Ingegneria Elettronica
Laboratorio di Strumentazione Virtuale  M Corso di Laurea in Ingegneria Elettronica
Laboratorio Automazione  M (Parte 2) Corso di Laurea in Ingegneria dell' Automazione

Available Thesis