Prof. Massimo Lanzoni DEIS, University of Bologna, Viale Risorgimento, 2 40136 Bologna - Italy Phone: (+39) 51 209-3078  Fax: (+39) 51 209-3785 email:    massimo.lanzoni at unibo.it

Biography

Since then he has been with the Microelectronics Research Group at the Department of Electronics at the same University working on research projects in the fields of the experimental characterization and simulation of NV memory cells and MOS devices, automatic test of VLSI devices.

In particular his scientific interests cover the characterization of thin dielectrics reliability, non-volatile memory cell characteristics and reliability, MOS transistors experimental characterization and new techniques for IC testing as NV memories endurance testing and CMOS IC latch-up testing, moder instrumentation, advanced sensors and sensor networks.
He is now involved in projects concerning applications of advanced instrumentation and electronic design  for industral and biomedical applications.

Teaching